Date
Place
- Room F (#117~118)
- WP. Poster Session
- July 25 (Wed.)
- 17:30-19:00 ~
- [WP-086]
- 17:30-19:00 ~
- Title:A Study of High Voltage Oxide Breakdown Voltage Drop Induced by Etch Damage in NAND Flash Memory
- Sungjin Jang1 and Byoung-Deog Choi2 (1Samsung Electronics Co., Ltd., Korea, 2Sungkyunkwan Univ., Korea)
Abstract Download
