Date
Place
- Room F (#117~118)
- FP. Poster Session
- July 27 (Fri.)
- 17:30-19:00 ~
- [FP-013]
- 17:30-19:00 ~
- Title:Improvement of Memory Characteristics of MIS-NVM Device Using Hydrogenated Gate Oxide
- Sehyeon Kim, Geonju Yoon, Jungsoo Kim, Sangho Kim, Youngseok Lee, Seongho Jeon, and Donggi Shin (Sungkyunkwan Univ., Korea)
Abstract Download
